Automotive Data Reliability
Tango AI Automotive PAT Solution
Data-Driven Part Average Testing to Ensure Every Automotive Chip is Reliable
Under the increasingly stringent quality requirements of automotive electronics, traditional Pass/Fail testing can no longer meet the zero-defect reliability standards. As a key statistical method, Part Average Test (PAT) has become an essential data filtering mechanism for Tier 1 suppliers, IDMs, and Fabless companies in shipment control.
Tango AI offers a comprehensive yield management solution with full support for PAT, empowering the automotive electronics supply chain to achieve preventive quality management. By identifying statistical anomalies while products still meet specifications, Tango AI helps proactively screen out marginal parts, significantly enhancing product stability and customer trust.
Challenge: High Sensitivity to Quality in Automotive Electronics
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Once a product enters automotive applications, any failure can lead to safety incidents.
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Customers demand PPB (parts per billion) level quality control.
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Components must withstand extreme conditions such as high temperature, high pressure, and vibration.
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Within-spec outliers have become a critical risk to reliability.
Core Advantages of the Tango AI Big Data Platform:
✦ Automated Calculation and Updating of Statistical Thresholds
Automatically generates mean and standard deviation based on product lot data to establish dynamic PAT thresholds, ensuring real-time reflection of process variations.
✦ Outlier Detection and Traceability Analysis
Automatically detects abnormal parts across batches and lots, providing fast anomaly comparison and visualized historical trend analysis.
✦ Correlation and Integration with CP/FT Data
Integrates wafer and final test data to analyze the behavior and origin of marginal parts.
✦ Compliant with AEC and OEM Customer PAT Requirements
Fully supports automotive test standards and report formats, helping customers accelerate automotive qualification and certification.
✦ Automated Reporting and Audit
Generates PAT analysis reports for QA, FAE, or third-party customer validation, reducing audit risks.
Application
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Proactively blocks potential failure parts from entering the market, enhancing brand trust
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Improves analysis efficiency and accuracy through big data algorithms and visualizations
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Reduces RMA (Return Material Authorization) rates and customer complaint risks
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Supports high-frequency PAT configuration maintenance, meeting the demands of multi-product and multi-site production
Tango AI
Establishing a Data Shield for Automotive-Grade Reliability
End-to-End Coverage: From Wafer Test to Outgoing Quality Control
Tango AI transforms PAT analysis from a reactive measure into a proactive mechanism embedded throughout the yield management process.
It helps you build a truly robust and secure quality defense in the highly competitive automotive electronics market.
Tango AI: Enabling Automotive Excellence Across the Supply Chain
Tier 1
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Screens potential failing chips through PAT data analysis to ensure consistent quality across the supply chain
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Enhances audit readiness and supplier quality control with real-time SPC/PAT report generation
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Enables fast response to OEM reliability qualification requirements (compliant with AEC standards)
IDM
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Deploys PAT thresholds and anomaly monitoring across WAT, CP, and FT stages
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Links design-side and manufacturing-side data to enable full-process anomaly traceability
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Improves early-stage chip yield, reducing RMA costs and customer complaint risks
OSAT
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Implements PAT screening at SLT, FT, and pre-shipment stages to proactively remove marginal parts
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Delivers real-time PAT reports and lot trend analysis to enhance customer service quality
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Flexibly supports diverse product lines with rapid deployment of customized PAT settings and threshold adjustments
Key Advantages of the Tango AI PAT Solution:
✦ Automatic PAT Threshold Setup and Updates
Dynamically calculates the mean and standard deviation for each lot to flexibly respond to process variations.
✦ Intelligent Identification of Abnormal Chips
Cross-lot and cross-stage outlier tracking to proactively block potential defective parts.
✦ Comprehensive Audit and Reporting System
Enables automated PAT reporting, outlier trend analysis, and compliance recordkeeping for streamlined quality management.
✦ Fully integrates with test data across all stations for end-to-end traceability and analysis.
Integrates WAT, CP, FT, SLT, and ASSY data to establish a consistent and end-to-end quality management framework.